INSTRUMENTATION

atomic force microscopy (AFM)

  • Bruker Dimension Icon

  • Imaging modes: contact, tapping, friction force, quantitative nanomechanical mapping, conductive probe, magnetic force

confocal Raman microspectroscopy

  • HORIBA Xplora Plus

  • 5x, 10x, and 100x objectives; 532 nm and 785 nm lasers; motorized stage for 2D and 3D mapping

tribo-rheology

  • TA Instruments DHR 20 (Discovery Hybrid Rheometer)

  • with tribology adapter

scanning electron microscopy (SEM)

  • [to be installed June 2022]

Fourier-transform infrared spectroscopy (FTIR)

  • Thermo Scientific Nicolet iS50 FTIR Spectrometer

  • with ATR accessory (attenuated total reflectance)