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INSTRUMENTATION
atomic force microscopy (AFM)
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Bruker Dimension Icon
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Imaging modes: contact, tapping, friction force, quantitative nanomechanical mapping, conductive probe, magnetic force
confocal Raman microspectroscopy
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HORIBA Xplora Plus
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5x, 10x, and 100x objectives; 532 nm and 785 nm lasers; motorized stage for 2D and 3D mapping
tribo-rheology
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TA Instruments DHR 20 (Discovery Hybrid Rheometer)
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with tribology adapter
scanning electron microscopy (SEM)
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[to be installed June 2022]
Fourier-transform infrared spectroscopy (FTIR)
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Thermo Scientific Nicolet iS50 FTIR Spectrometer
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with ATR accessory (attenuated total reflectance)
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